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A highly versatile 0.18 μm CMOS technology with dense embedded SRAM

Paper Details
Authors:
Mousumi Bhat
Song Shi
Piotr Grudowski
Chenjia Feng
B. Lee
R. Nagabushnam
J. Moench
C.D. Gunderson
P. Schani
L. Day
S. Bishop
Huajun Tian
Jin-Young Chung
Craig Lage
Jackie Ellis
N. Herr
P. Gilbert
Arindam Das
F. Nkansah
M. Woo
Mark R. Wilson
D. Derr
L. Terpolilli
K. Weidemann
Roger Stout
Alister Hamilton
T. Lii
Fanghao Huang
Kevin Cox
Jonathan Scott
Publication Date: 2002-11-07
Semiconductor materials and devicesEngineeringElectrical and Electronic EngineeringPhysical Sciences
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